Frontline PCB Solutions announces the release of version 9.2 of its Genesis 2000 CAM system on July 26, 2007.
Genesis 9.2 improves the quality of chemically etched layers through a new Etch Analysis module that simulates the etch effect on existing job data. Users can now graphically view potential open and short problems on the netlist. In addition, Genesis 9.2 improves data quality and speed through enhanced Dynamic Etch Compensation capabilities, including faster running speeds and the ability to set feature type priority during compensation.
Genesis 9.2 can increase your productivity and enable advanced board testability through a new Gold Tie Bar Creation DFM and a new Netlist Optimizer, as well as a range of interactive editing tools including feature measurement, highlighting, support for new barcode types, the step and repeat editor, and print function enhancements. Users will benefit from improved bitmap input and RS274X macro conversion to standard symbols, zipped ODB++ data read-in, support for X/Y path optimization in the Auto Drill Manager, and full LCM to support all open windows. Also in this version, greater efficiency in Orbotech DI–Genesis integration is made available to users via a new graphical DI interface.
A licensed version, Genesis 9.2 is provided to all customers with an Orbotech service contract.
